Invention Grant
US07936040B2 Schottky barrier quantum well resonant tunneling transistor 有权
肖特基势垒量子阱谐振隧穿晶体管

  • Patent Title: Schottky barrier quantum well resonant tunneling transistor
  • Patent Title (中): 肖特基势垒量子阱谐振隧穿晶体管
  • Application No.: US12258425
    Application Date: 2008-10-26
  • Publication No.: US07936040B2
    Publication Date: 2011-05-03
  • Inventor: Koucheng Wu
  • Applicant: Koucheng Wu
  • Applicant Address: TW Hsingchu
  • Assignee: Koucheng Wu
  • Current Assignee: Koucheng Wu
  • Current Assignee Address: TW Hsingchu
  • Agency: SV Patent Service
  • Main IPC: H01L29/47
  • IPC: H01L29/47
Schottky barrier quantum well resonant tunneling transistor
Abstract:
A semiconductor transistor device includes one or more conductive base regions, a first semiconductor barrier region, a second semiconductor barrier region, a conductive emitter region, and a conductive collector region. The first semiconductor barrier region or the second semiconductor barrier region has a dimension smaller than 100 Å. A first Schottky barrier junction is formed at the interface of the first semiconductor barrier region and the one or more conductive base regions. A second Schottky barrier junction is formed at the interface of the second semiconductor barrier region and the one or more conductive base regions. A third Schottky barrier junction is formed at the interface of the conductive emitter region and the first semiconductor barrier region. A fourth Schottky barrier junction is formed at the interface of the conductive collector region and the second semiconductor barrier region.
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