• Patent Title: Exposure apparatus, supply method and recovery method, exposure method, and device producing method
  • Application No.: US10589437
    Application Date: 2005-02-17
  • Publication No.: US07936440B2
    Publication Date: 2011-05-03
  • Inventor: Kenichi Shiraishi
  • Applicant: Kenichi Shiraishi
  • Applicant Address: JP Tokyo
  • Assignee: Nikon Corporation
  • Current Assignee: Nikon Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Staas & Halsey LLP
  • Priority: JPP2004-045102 20040220
  • International Application: PCT/JP2005/002461 WO 20050217
  • International Announcement: WO2005/081292 WO 20050901
  • Main IPC: G03B27/52
  • IPC: G03B27/52
Exposure apparatus, supply method and recovery method, exposure method, and device producing method
Abstract:
The present invention provides an exposure apparatus that can prevent the degradation of exposure and measurement accuracies. An exposure apparatus (EX) exposes a substrate (P) by irradiating the substrate (P) with exposure light (EL) through a projection optical system (PL) and a liquid (LQ), and comprises: a liquid supply mechanism (10) that supplies the liquid (LQ) between an optical element (2) at the image plane side tip part of the projection optical system (PL) and a substrate (P) that opposes the optical element (2); a timer (60) that measures the time that has elapsed since the supply of the liquid by the liquid supply mechanism (10) was started; and a control apparatus (CONT) that determines, based on a measurement result of the timer (60), whether a space(SP), which is between the optical element (2) and the substrate (P) and includes at least an optical path of the exposure light (EL), is filled with the liquid (LQ).
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