Invention Grant
US07936618B2 Memory circuit and method of sensing a memory element 有权
记忆电路和感测存储元件的方法

  • Patent Title: Memory circuit and method of sensing a memory element
  • Patent Title (中): 记忆电路和感测存储元件的方法
  • Application No.: US12297287
    Application Date: 2007-04-19
  • Publication No.: US07936618B2
    Publication Date: 2011-05-03
  • Inventor: Maurits Storms
  • Applicant: Maurits Storms
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP06112988 20060424
  • International Application: PCT/IB2007/051414 WO 20070419
  • International Announcement: WO2007/122564 WO 20071101
  • Main IPC: G11C7/12
  • IPC: G11C7/12 G11C7/06
Memory circuit and method of sensing a memory element
Abstract:
The memory circuit comprises at least one memory element (T1), a sense amplifier (SA) for sensing a state of the memory element (T1), a switching device (T2) for selectively coupling the sense amplifier (SA) to the memory element (T1), The sense amplifier (SA) comprises a first module (M1) and a second module (M2). The first module (M1) provides a first current limited to a maximum value (Iref+Ibias). The second module (M2) provides a second current which decreases from a value higher than the maximum value at the start of a sensing operation until a value lower than the maximum value at the end of the sensing operation. The memory circuit has a third module (CS2) for sinking a third current (Ibias) at a side of the switching device (T2) coupled to the memory element (T1).
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