Invention Grant
US07936633B2 Circuit and method of generating voltage of semiconductor memory apparatus 失效
电路和半导体存储装置的电压产生方法

  • Patent Title: Circuit and method of generating voltage of semiconductor memory apparatus
  • Patent Title (中): 电路和半导体存储装置的电压产生方法
  • Application No.: US12575663
    Application Date: 2009-10-08
  • Publication No.: US07936633B2
    Publication Date: 2011-05-03
  • Inventor: Khil-Ohk Kang
  • Applicant: Khil-Ohk Kang
  • Applicant Address: KR Gyeonggi-Do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-Do
  • Agency: Venable LLP
  • Agent Jeffri A. Kaminski
  • Priority: KR10-2006-0112257 20061114
  • Main IPC: G11C5/14
  • IPC: G11C5/14
Circuit and method of generating voltage of semiconductor memory apparatus
Abstract:
A circuit for generating a voltage of a semiconductor memory apparatus includes a control unit that outputs a driving control signal in response to an enable signal and a burn-in signal, a first voltage generating unit that generates and outputs a first voltage in response to the enable signal, and a voltage maintaining unit that maintains the first voltage in response to the driving control signal.
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