Invention Grant
- Patent Title: Face feature point detection apparatus and feature point detection apparatus
- Patent Title (中): 面部特征点检测装置和特征点检测装置
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Application No.: US11667670Application Date: 2004-11-12
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Publication No.: US07936902B2Publication Date: 2011-05-03
- Inventor: Koichi Kinoshita
- Applicant: Koichi Kinoshita
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Dickstein Shapiro LLP
- International Application: PCT/JP2004/016889 WO 20041112
- International Announcement: WO2006/051607 WO 20060518
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Plural nodes are arranged at predetermined initial positions, and feature values at plural sampling points around each node are obtained as a node feature value of each corresponding node. An error estimator indicating displacement between the current position of each node and the position of corresponding feature point is obtained based on correlation information on a difference between the node feature value obtained in a state in which the plural nodes are arranged at correct positions of the corresponding feature points and the node feature value obtained in a state in which the plural nodes are arranged at wrong positions of the corresponding feature points in a learning image, correlation information on a difference between the correct position and the wrong position, and a node feature value of each node. The position of each feature point is estimated in an input image based on the error estimator and the current position of each node.
Public/Granted literature
- US20080130961A1 Face Feature Point Detection Apparatus and Feature Point Detection Apparatus Public/Granted day:2008-06-05
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