Invention Grant
US07936912B2 Sample imaging apparatus, sample analyzing apparatus, and sample imaging method
有权
样品成像装置,样品分析装置和样品成像方法
- Patent Title: Sample imaging apparatus, sample analyzing apparatus, and sample imaging method
- Patent Title (中): 样品成像装置,样品分析装置和样品成像方法
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Application No.: US11540156Application Date: 2006-09-29
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Publication No.: US07936912B2Publication Date: 2011-05-03
- Inventor: Ryuichi Tohma , Hideyuki Higuchi , Masanori Nakaya
- Applicant: Ryuichi Tohma , Hideyuki Higuchi , Masanori Nakaya
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2005-287463 20050930
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A sample imaging apparatus comprising: a sample image obtainer for obtaining an image of a sample smeared on a sample holder, the sample holder comprising an identification part which comprises identification information of the sample; an identification detector for detecting the identification information; an identification part image obtainer for obtaining an identification part image comprising an image of at least a portion of the identification part; an output device; and a controller for controlling the output device, such that the image of the sample and the identification part image are output when the identification detector can not detect the identification information is disclosed. A sample analyzing system, a sample analyzing apparatus, and a sample imaging method are also disclosed.
Public/Granted literature
- US20070077550A1 Sample imaging apparatus, sample analyzing apparatus, and sample imaging method Public/Granted day:2007-04-05
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