Invention Grant
US07937507B2 Extended measurement word determination at a channel subsystem of an I/O processing system
有权
在I / O处理系统的通道子系统上扩展测量字确定
- Patent Title: Extended measurement word determination at a channel subsystem of an I/O processing system
- Patent Title (中): 在I / O处理系统的通道子系统上扩展测量字确定
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Application No.: US12030920Application Date: 2008-02-14
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Publication No.: US07937507B2Publication Date: 2011-05-03
- Inventor: Mark P. Bendyk , Daniel F. Casper , John R. Flanagan , Roger G. Hathorn , Catherine C. Huang , Matthew J. Kalos , Louis W. Ricci , Gustav E. Sittmann , Harry M. Yudenfriend
- Applicant: Mark P. Bendyk , Daniel F. Casper , John R. Flanagan , Roger G. Hathorn , Catherine C. Huang , Matthew J. Kalos , Louis W. Ricci , Gustav E. Sittmann , Harry M. Yudenfriend
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent John Campbell
- Main IPC: G06F13/00
- IPC: G06F13/00

Abstract:
An article of manufacture, an apparatus, and a method for determining an extended measurement word at a channel subsystem of an I/O processing system using data from a control unit are provided. The article of manufacture includes at least one computer usable medium having computer readable program code logic. The computer readable program code logic performs a method including sending a command message to the control unit, and receiving a transport response information unit message at the channel subsystem in response to sending the command message to the control unit. The computer readable program code logic additionally extracts a plurality of time values from the transport response information unit message as calculated by the control unit, calculates an extended measurement word as a function of the time values, and writes the extended measurement word to computer readable memory in the I/O processing system.
Public/Granted literature
- US20090210570A1 EXTENDED MEASUREMENT WORD DETERMINATION AT A CHANNEL SUBSYSTEM OF AN I/O PROCESSING SYSTEM Public/Granted day:2009-08-20
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