Invention Grant
- Patent Title: Method and system for autonomic target testing
- Patent Title (中): 自主目标检测方法与系统
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Application No.: US11618358Application Date: 2006-12-29
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Publication No.: US07937622B2Publication Date: 2011-05-03
- Inventor: Mudit Mehrotra
- Applicant: Mudit Mehrotra
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hamilton, Brook, Smith & Reynolds, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A target is autonomically tested using a number of test cases. Dependencies among the test cases exist. A dependency between a first test case and a second test case means that where testing of the target using the first test case results in failure, testing of the target using the second test case is not performed. The dependencies among the test cases are constructed using one or more dependency rules. The dependency rules are updated while testing of the target using the test cases is performed, such that new dependencies among the test eases revealed during testing are incorporated into the dependency rules. Autonomic testing in this way provides for more intelligent testing of the target without human interaction and/or human intervention.
Public/Granted literature
- US20080163003A1 Method and System for Autonomic Target Testing Public/Granted day:2008-07-03
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