Invention Grant
- Patent Title: Non-destructive examination apparatus and method for guided waves
- Patent Title (中): 导波无损检测装置及方法
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Application No.: US11946281Application Date: 2007-11-28
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Publication No.: US07938008B2Publication Date: 2011-05-10
- Inventor: Steven E. Owens , Joseph L. Rose , Roger L. Royer, Jr.
- Applicant: Steven E. Owens , Joseph L. Rose , Roger L. Royer, Jr.
- Applicant Address: US PA State College
- Assignee: FBS, Inc.
- Current Assignee: FBS, Inc.
- Current Assignee Address: US PA State College
- Agency: Duane Morris LLP
- Main IPC: G01N29/00
- IPC: G01N29/00

Abstract:
A method of performing a non-destructive examination of a piece of material, having the steps of providing an angle beam wedge and at least two transducers placed upon the wedge, wherein the transducers are placed in a phased array, placing the wedge upon the piece of material to be examined, producing a guided wave into the piece of material to be examined, wherein the guided wave is placed into the material through a synthetically changed incident angle, receiving the guided wave from the piece of material, and determining one of a presence of defects and lack of defects in the piece of material from the received guided wave. Transducers used may include 360 degree guided wave, radial polarized units, parallel shear units for shear horizontal activation and guided wave wheel probes.
Public/Granted literature
- US20080127732A1 NON-DESTRUCTIVE EXAMINATION APPARATUS AND METHOD FOR GUIDED WAVES Public/Granted day:2008-06-05
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