Invention Grant
- Patent Title: High shock test apparatus
- Patent Title (中): 高冲击试验装置
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Application No.: US12130248Application Date: 2008-05-30
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Publication No.: US07938011B1Publication Date: 2011-05-10
- Inventor: David Falabella , Gary A. Simpson
- Applicant: David Falabella , Gary A. Simpson
- Applicant Address: US MD Bethesda
- Assignee: Lockheed Martin Corporation
- Current Assignee: Lockheed Martin Corporation
- Current Assignee Address: US MD Bethesda
- Agent Jeffrey D. Myers; Samantha A. Updegraff; Timothy D. Stanley
- Main IPC: G01N29/00
- IPC: G01N29/00
Abstract:
A testing apparatus and method comprising providing a platform for a unit under test, charging a capacitor bank with a charging system, with a switching and power control system generating multiple pulses per cycle from energy from the capacitor bank, and with an electromagnetic force generator receiving pulses from the switching and power control system and directing force at the platform.
Information query
