Invention Grant
- Patent Title: Method of filling a trench in a substrate
- Patent Title (中): 在衬底中填充沟槽的方法
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Application No.: US12277339Application Date: 2008-11-25
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Publication No.: US07939419B2Publication Date: 2011-05-10
- Inventor: Ki-Sub Lee
- Applicant: Ki-Sub Lee
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2007-0121216 20071127
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
A method of filling a trench includes: providing a substrate having an upper surface, and a trench extending therein from the upper surface; forming a deposition layer on the substrate in a manner in which the layer partially fills the trench and has a portion which overhangs the trench at the upper surface of the substrate; etching, in a processing chamber, the portion of the deposition layer which overhangs the trench, including by inducing a reaction in the processing chamber using plasma; and subsequently depositing material on the substrate within the partially filled trench, including by inducing a reaction in the processing chamber using plasma.
Public/Granted literature
- US20090137094A1 METHOD OF FILLING A TRENCH IN A SUBSTRATE Public/Granted day:2009-05-28
Information query
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