Invention Grant
- Patent Title: Method and apparatus for testing magnetoresistive effect element
- Patent Title (中): 用于测试磁阻效应元件的方法和装置
-
Application No.: US12349891Application Date: 2009-01-07
-
Publication No.: US07940042B2Publication Date: 2011-05-10
- Inventor: Takumi Yanagisawa
- Applicant: Takumi Yanagisawa
- Applicant Address: JP Tokyo
- Assignee: TDK Corporation
- Current Assignee: TDK Corporation
- Current Assignee Address: JP Tokyo
- Agency: Frommer Lawrence & Haug LLP
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G01R31/02

Abstract:
A method for testing an MR element includes a step of obtaining a ferromagnetic resonance frequency f0 of the MR element to be tested by applying an external magnetic field in a track-width direction to the MR element, a step of calculating a stiffness magnetic field Hstiff from the obtained ferromagnetic resonance frequency f0 using a predetermined formula, a step of obtaining a relationship of a stiffness magnetic field Hstiff with respect to an external magnetic field applied in the track-width direction from the applied external magnetic field and the calculated stiffness magnetic field Hstiff, a step of obtaining a uniaxial anisotropic magnetic field Hk of a free layer of the MR element from the obtained relationship of the stiffness magnetic field Hstiff with respect to the external magnetic field applied, and a step of judging whether the MR element is good product or not by comparing the obtained uniaxial anisotropic magnetic field Hk with a predetermined threshold.
Public/Granted literature
- US20100171494A1 Method and Apparatus for Testing Magnetoresistive Effect Element Public/Granted day:2010-07-08
Information query