Invention Grant
- Patent Title: Method for testing circuit breakers
- Patent Title (中): 断路器测试方法
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Application No.: US12076962Application Date: 2008-03-26
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Publication No.: US07940051B2Publication Date: 2011-05-10
- Inventor: Algerd M. Ulinskas
- Applicant: Algerd M. Ulinskas
- Main IPC: G01R31/327
- IPC: G01R31/327

Abstract:
A method for testing low voltage power circuit breakers having an electronic trip unit which includes a display and a microprocessor for controlling various protective functions and storing settings for such functions which can be selected and performed. Entering into the test mode disables functions not necessary for the testing to be performed. A current is injected into one of the phases of the breaker. The technician observes whether the breaker performs within the specifications for the selected protective function. Upon exiting the test mode, the breaker is automatically restored to the settings prior to the testing.
Public/Granted literature
- US20090243620A1 Method for testing circuit breakers Public/Granted day:2009-10-01
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