Invention Grant
US07940070B2 Singulated bare die testing fixture 失效
单芯裸芯片测试夹具

Singulated bare die testing fixture
Abstract:
A flexible redistribution membrane and a piece of silicon rubber is used in a testing fixture for testing a singulated bare die. The silicon rubber is used as a cushion under the flexible redistribution membrane against the downward pressure from the bare die during testing so that the top pads of the flexible redistribution membrane can be electrically tight coupling to bottom pads of the bared die to be tested.
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