Invention Grant
US07940072B2 Timing generator and semiconductor test apparatus 失效
定时发生器和半导体测试装置

  • Patent Title: Timing generator and semiconductor test apparatus
  • Patent Title (中): 定时发生器和半导体测试装置
  • Application No.: US11989713
    Application Date: 2006-07-28
  • Publication No.: US07940072B2
    Publication Date: 2011-05-10
  • Inventor: Masakatsu Suda
  • Applicant: Masakatsu Suda
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corp.
  • Current Assignee: Advantest Corp.
  • Current Assignee Address: JP Tokyo
  • Agency: Muramatsu & Associates
  • Priority: JP2005-220766 20050729
  • International Application: PCT/JP2006/314953 WO 20060728
  • International Announcement: WO2007/013577 WO 20070201
  • Main IPC: G01R31/26
  • IPC: G01R31/26
Timing generator and semiconductor test apparatus
Abstract:
A variable delay circuit has a simple configuration for being incorporated in a timing generator to control a delay time in real time and assure a timing margin. The variable delay circuit of the timing generator includes a delay circuit having a plurality of cascaded clock buffers; a plurality of cascaded data buffers; and data holding circuits for outputting data to the data buffers in accordance with the clock from the delay circuit. The delay amount added to the data by the data buffers is made identical to the delay amount added to the clock by the clock buffers.
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