Invention Grant
- Patent Title: Duty cycle correction systems and methods
- Patent Title (中): 占空比校正系统和方法
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Application No.: US12400495Application Date: 2009-03-09
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Publication No.: US07940103B2Publication Date: 2011-05-10
- Inventor: Yasuo Satoh , Eric Booth
- Applicant: Yasuo Satoh , Eric Booth
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: H03K3/017
- IPC: H03K3/017

Abstract:
Duty cycle correction systems and methods of adjusting duty cycles are provided. One such duty cycle correction system includes a duty cycle adjustor and a variable delay line coupled to the output of the duty cycle adjustor. First and second phase detectors have first inputs coupled to the output of the duty cycle adjustor through an inverter and second inputs coupled to the output of the variable delay line. The phase detectors cause the delay line to align rising or falling edges of signals at the output of the delay line with rising or falling edges, respectively, of signals at the output of the inverter. The controller simultaneously causes the duty cycle adjustor to adjust the duty cycle of the output clock signal until the rising and falling edges of signals at the output of the delay line are aligned with rising and falling edges, respectively, of signals at the output of the inverter.
Public/Granted literature
- US20100225372A1 DUTY CYCLE CORRECTION SYSTEMS AND METHODS Public/Granted day:2010-09-09
Information query
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