An inrush voltage clamping circuit for an electronic device for clamping an inrush voltage induced by hot plugging is disclosed. The clamp circuit includes a buffer unit and a clamp unit. The buffer unit is coupled to an input power end for receiving an inrush current of the inrush voltage. The clamp unit is coupled to the input power end and the buffer unit for controlling the buffer unit to receive the inrush current according to an input voltage of the input power end.