Invention Grant
- Patent Title: Systems and methods for analyzing nanoreporters
- Patent Title (中): 用于分析纳米载体的系统和方法
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Application No.: US11805273Application Date: 2007-05-21
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Publication No.: US07941279B2Publication Date: 2011-05-10
- Inventor: Jenq-Neng Hwang , Jeffrey D. Mitton
- Applicant: Jenq-Neng Hwang , Jeffrey D. Mitton
- Applicant Address: US WA Seattle
- Assignee: Nanostring Technologies, Inc.
- Current Assignee: Nanostring Technologies, Inc.
- Current Assignee Address: US WA Seattle
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Agent Ivor R. Elrifi, Esq.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Methods, computers, and computer program products for detecting the presence of a probe within a sample overlayed on a substrate are provided. The probe comprises a plurality of spatially arranged labels. A data storage module stores a plurality of light images, where each light image has light from the sample at a corresponding wavelength range in a plurality of different wavelength ranges. A label identification module identifies a plurality of labels in the plurality of light images that are proximate to each other on the substrate. A spatial order of the plurality of labels determines a string sequence of the plurality of labels. A probe identification module determines whether the string sequence of the plurality of labels comprises a valid reporter sequence.
Public/Granted literature
- US20100262374A1 Systems and methods for analyzing nanoreporters Public/Granted day:2010-10-14
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