Invention Grant
- Patent Title: Measurement system, management device and processing distribution method using the system
- Patent Title (中): 测量系统,管理设备和使用系统的处理分配方法
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Application No.: US11601733Application Date: 2006-11-20
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Publication No.: US07941485B2Publication Date: 2011-05-10
- Inventor: Atsushi Ogino
- Applicant: Atsushi Ogino
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Stites & Harbison, PLLC
- Agent Juan Carlos A. Marquez, Esq.
- Priority: JP2005-345394 20051130
- Main IPC: G06F15/16
- IPC: G06F15/16

Abstract:
In a measurement system that comprises plural measurement devices classified by groups, and plural data processing devices on a network that receives and processes measured data from the measurement devices, the data processing devices are smoothly allocated. The measurement devices belong to groups based on the areas in which they are located, and respectively transmit measured data to a multicast address defined for each of the groups to which they belong. A management device detects an overloaded or failed data processing device, stops data processing on a multicast address at which the data processing device receives data, alternatively commands another less loaded data processing device to join the multicast group, receive measured data transmitted to the multicast address, and process the data.
Public/Granted literature
- US20070182584A1 Measurement system, management device and processing distribution method using the same Public/Granted day:2007-08-09
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