Invention Grant
- Patent Title: Electronic device testing system
- Patent Title (中): 电子设备测试系统
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Application No.: US11369648Application Date: 2006-03-07
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Publication No.: US07941718B2Publication Date: 2011-05-10
- Inventor: Zaifu Zhang , Robert Bailey
- Applicant: Zaifu Zhang , Robert Bailey
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A method and system for testing an electronic device is disclosed. The method includes loading a first test into a test pattern generator of a first device and generating a first test pattern at the test pattern generator. A second test seed is loaded into the test pattern generator while the first test pattern is being generated. In one embodiment, the state of the test pattern generator is modified based upon the second test seed, and the first test seed.
Public/Granted literature
- US20070214398A1 Electronic device testing system Public/Granted day:2007-09-13
Information query
