Invention Grant
US07941721B2 System and a method for testing connectivity between a first device and a second device
有权
系统和用于测试第一设备和第二设备之间的连接性的方法
- Patent Title: System and a method for testing connectivity between a first device and a second device
- Patent Title (中): 系统和用于测试第一设备和第二设备之间的连接性的方法
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Application No.: US12550516Application Date: 2009-08-31
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Publication No.: US07941721B2Publication Date: 2011-05-10
- Inventor: Michael Priel , Leonid Fleshel , Anton Rozen
- Applicant: Michael Priel , Leonid Fleshel , Anton Rozen
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A device and a method for testing a connectivity between a first device and a second device, the method includes: writing, at a first frequency and in a serial manner, a first test word to a source boundary scan register; writing a content of the source boundary scan register, at a second frequency and in a parallel manner, to a target boundary scan register; wherein the second frequency is higher than the first frequency; reading the content of the target boundary scan register; wherein the source and target boundary scan registers are selected from a first boundary scan register of the first device and a second boundary scan register of the second device; and evaluating a connectivity between the first and second device in response to a relationship between the first test word and the content of the target boundary scan register.
Public/Granted literature
- US20110055648A1 SYSTEM AND A METHOD FOR TESTING CONNECTIVITY BETWEEN A FIRST DEVICE AND A SECOND DEVICE Public/Granted day:2011-03-03
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