Invention Grant
- Patent Title: Methods and apparatuses for thermal analysis based circuit design
- Patent Title (中): 基于热分析的电路设计方法与装置
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Application No.: US12053453Application Date: 2008-03-21
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Publication No.: US07941779B2Publication Date: 2011-05-10
- Inventor: Khalid Rahmat , Kenneth S. McElvain
- Applicant: Khalid Rahmat , Kenneth S. McElvain
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Blakely, Sokoloff, Taylor & Zafman, LLP
- Agent Judith A. Szepesi
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Methods and apparatuses for circuit design to reduce power usage, such as reducing temperature dependent power usage, and/or to improve timing, such as reducing temperature dependent delay or transition time. At least one embodiment of the present invention reduces the power dissipation and improves the timing of an integrated circuit to optimize the design. A thermal analysis is used to determine the temperature dependent power dissipation of a circuit and the temperature distribution of the circuit resulting from dissipating the heat created by the temperature dependent power dissipation. Then, the components of the design are selectively transformed to reduce the power dissipation and to improve timing based on the temperature solution. The transformation may include placement changes and netlist changes, such as the change of transistor threshold voltages for cells or for blocks of the circuit chip.
Public/Granted literature
- US20080168406A1 METHODS AND APPARATUSES FOR THERMAL ANALYSIS BASED CIRCUIT DESIGN Public/Granted day:2008-07-10
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