Invention Grant
US07946156B2 Glide test heads using heating elements to form a planar detection surface
有权
滑动测试头使用加热元件形成平面检测表面
- Patent Title: Glide test heads using heating elements to form a planar detection surface
- Patent Title (中): 滑动测试头使用加热元件形成平面检测表面
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Application No.: US11964688Application Date: 2007-12-26
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Publication No.: US07946156B2Publication Date: 2011-05-24
- Inventor: Shanlin Duan , Jizhong He , Bruno Marchon , Ullal V. Nayak
- Applicant: Shanlin Duan , Jizhong He , Bruno Marchon , Ullal V. Nayak
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
- Current Assignee Address: NL Amsterdam
- Agency: Duft Bornsen & Fishman, LLP
- Main IPC: G11B5/455
- IPC: G11B5/455 ; G01B7/34 ; G01B5/28

Abstract:
Glide test systems and associated methods are described. A glide test system includes a glide test head that is flown over the surface of a recording disk to detect asperities on the recording disk. The glide test head includes a detection pad on the trailing end of the head. Heating elements are fabricated proximate to the detection pad. The heating elements are independently controllable to control the amount of protrusion of different regions of the detection pad. The heating elements thus provide a way to substantially flatten the detection surface of the detection pad, and compensate for an uneven topography on a detection surface.
Public/Granted literature
- US20090165539A1 GLIDE TEST HEADS USING HEATING ELEMENTS TO FORM A PLANAR DETECTION SURFACE Public/Granted day:2009-07-02
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