Invention Grant
- Patent Title: Composition for forming anti-reflective coat
- Patent Title (中): 用于形成抗反射涂层的组合物
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Application No.: US10520461Application Date: 2003-07-11
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Publication No.: US07947424B2Publication Date: 2011-05-24
- Inventor: Takahiro Kishioka , Shinya Arase , Ken-ichi Mizusawa , Keisuke Nakayama
- Applicant: Takahiro Kishioka , Shinya Arase , Ken-ichi Mizusawa , Keisuke Nakayama
- Applicant Address: JP Tokyo
- Assignee: Nissan Chemical Industries, Ltd.
- Current Assignee: Nissan Chemical Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2002-208045 20020717; JP2002-302535 20021017
- International Application: PCT/JP03/08832 WO 20030711
- International Announcement: WO2004/008253 WO 20040122
- Main IPC: G03F7/00
- IPC: G03F7/00 ; G03F7/004 ; G03F7/26

Abstract:
There is provided a composition for forming anti-reflective coating containing a urea compound substituted by hydroxyalkyl group or alkoxyalkyl group, and preferably a light absorbing compound and/or a light absorbing resin; a method of forming a anti-reflective coating for a semiconductor device by use of the composition; and a process for manufacturing a semiconductor device by use of the composition. The composition according to the present invention exhibits a good light-absorption to a light having a wavelength used for manufacturing a semiconductor device. Therefore, the composition exerts a high protection effect against light reflection, and has a high dry etching rate compared with photoresist layers.
Public/Granted literature
- US20050175927A1 Composition for antireflection film formation Public/Granted day:2005-08-11
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