Invention Grant
US07947446B2 High throughput mutation screening methods and kits using a universalized approach—differential sequence fill-in (DSF)-enabled sequential adapter ligation and amplification
有权
使用通用化方法 - 差异序列填充(DSF)的顺序适配器连接和扩增的高通量突变筛选方法和试剂盒
- Patent Title: High throughput mutation screening methods and kits using a universalized approach—differential sequence fill-in (DSF)-enabled sequential adapter ligation and amplification
- Patent Title (中): 使用通用化方法 - 差异序列填充(DSF)的顺序适配器连接和扩增的高通量突变筛选方法和试剂盒
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Application No.: US12151650Application Date: 2008-05-08
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Publication No.: US07947446B2Publication Date: 2011-05-24
- Inventor: Ming-Sheng Lee , Chung-Han Lee , Jeffery Lee
- Applicant: Ming-Sheng Lee , Chung-Han Lee , Jeffery Lee
- Agency: DLC Patents, PLLC
- Agent Dustin L. Call
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12P19/34

Abstract:
This disclosure teaches high throughput mutation screening methods allowing simultaneous analysis of multiple genetic regions of interest and sensitive detection of very low frequency mutation(s) by the use of a universalized approach. Methods comprise treating RNA:DNA heteroduplexes of interest with a ribonuclease, sequence extension by an RNA-primed DNA polymerase, ligation with a blocking adapter, and differential sequence fill-in followed by single-strand-specific nuclease digestion to permit full-length sequence extension and subsequent ligation with a tagged reporter adapter solely in mutants filled in with a complementary deoxyribonucleotide triphosphate. By forming tagged mutant-dual adapter hybrids or mutant-triple adapter hybrids, the detection and/or quantification of mutants may be directed to the commonly shared tag(s) or flanking adapter sequences for signal detection/enhancement or sequence amplification in all different mutants regardless of the source or the number of mutations involved, thereby avoiding the tremendous effort of multiple target-specific sequence amplifications. Methods may be performed wholly or partially in solution, on solid phase media, in large scale, adapted for automated or semi-automated analysis, and any combinations thereof.
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