Invention Grant
US07947576B2 Method of manufacturing by etching a semiconductor substrate horizontally without creating a vertical face
有权
通过在不产生垂直面的情况下水平蚀刻半导体衬底来制造方法
- Patent Title: Method of manufacturing by etching a semiconductor substrate horizontally without creating a vertical face
- Patent Title (中): 通过在不产生垂直面的情况下水平蚀刻半导体衬底来制造方法
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Application No.: US12401754Application Date: 2009-03-11
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Publication No.: US07947576B2Publication Date: 2011-05-24
- Inventor: Tomoki Igari , Mitsuhiko Ogihara , Hiroyuki Fujiwara , Hironori Furuta , Takahito Suzuki , Tomohiko Sagimori , Yusuke Nakai
- Applicant: Tomoki Igari , Mitsuhiko Ogihara , Hiroyuki Fujiwara , Hironori Furuta , Takahito Suzuki , Tomohiko Sagimori , Yusuke Nakai
- Applicant Address: JP Tokyo
- Assignee: Oki Data Corporation
- Current Assignee: Oki Data Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mots Law, PLLC
- Agent Marvin A. Motsenbocker
- Priority: JPJP2008-076169 20080324
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
An aspect of the invention provides a method of manufacturing a method of manufacturing a semiconductor element comprises the steps of: growing epitaxially a semiconductor layer on top of a semiconductor substrate; forming a patterned portion of the grown semiconductor layer by forming a pattern by a patterning process on top of the grown semiconductor layer; removing a portion of the semiconductor layer other than the patterned portion by a first etching method with a first etchant; and immersing a resultant from the first etching method in a second etchant that etches only the semiconductor substrate by a second etching method thereby removing the substrate from the semiconductor layer.
Public/Granted literature
- US20090239361A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2009-09-24
Information query
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