Invention Grant
- Patent Title: Apparatus and method for detecting terahertz wave
- Patent Title (中): 用于检测太赫兹波的装置和方法
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Application No.: US12701359Application Date: 2010-02-05
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Publication No.: US07947955B2Publication Date: 2011-05-24
- Inventor: Yukio Kawano , Koji Ishibashi
- Applicant: Yukio Kawano , Koji Ishibashi
- Applicant Address: JP Saitama
- Assignee: Riken
- Current Assignee: Riken
- Current Assignee Address: JP Saitama
- Agency: Griffin & Szipl, P.C.
- Priority: JP2009-027537 20090209
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
A terahertz wave detecting apparatus includes a semiconductor chip 12, a two-dimensional graphene 14, a conductive source electrode 15, and a drain electrode 16 and a gate electrode 17. The two-dimensional graphene 14 is connected to the source electrode and the drain electrode. The apparatus further includes a SD voltage detection circuit 18, a gate voltage applying circuit 19 and a magnetic field generating device 20.
Public/Granted literature
- US20100200755A1 APPARATUS AND METHOD FOR DETECTING TERAHERTZ WAVE Public/Granted day:2010-08-12
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