Invention Grant
- Patent Title: MOS device with varying trench depth
- Patent Title (中): 具有不同沟槽深度的MOS器件
-
Application No.: US12228142Application Date: 2008-08-07
-
Publication No.: US07948029B2Publication Date: 2011-05-24
- Inventor: Anup Bhalla , Xiaobin Wang
- Applicant: Anup Bhalla , Xiaobin Wang
- Applicant Address: US CA Sunnyvale
- Assignee: Alpha and Omega Semiconductor Incorporated
- Current Assignee: Alpha and Omega Semiconductor Incorporated
- Current Assignee Address: US CA Sunnyvale
- Agency: Van Pelt, Yi & James LLP
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119

Abstract:
A semiconductor device includes a drain, an epitaxial layer overlaying the drain, a body disposed in the epitaxial layer, a source embedded in the body, a gate trench extending into the epitaxial layer, a gate disposed in the gate trench, an active region contact trench extending through the source, the active region contact trench having a varying contact trench depth, and an active region contact electrode disposed within the active region contact trench.
Public/Granted literature
- US20090127593A1 MOS device Public/Granted day:2009-05-21
Information query
IPC分类: