Invention Grant
- Patent Title: Test handler
- Patent Title (中): 测试处理程序
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Application No.: US11997974Application Date: 2006-08-14
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Publication No.: US07948255B2Publication Date: 2011-05-24
- Inventor: Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
- Applicant: Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
- Applicant Address: KR Hwaseung-si
- Assignee: TechWing Co., Ltd
- Current Assignee: TechWing Co., Ltd
- Current Assignee Address: KR Hwaseung-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2005-0075534 20050818
- International Application: PCT/KR2006/003178 WO 20060814
- International Announcement: WO2007/021112 WO 20070222
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R31/00

Abstract:
A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.
Public/Granted literature
- US20080193271A1 Test Handler Public/Granted day:2008-08-14
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