Invention Grant
- Patent Title: Display device and inspection method for display device
- Patent Title (中): 显示装置的显示装置和检查方法
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Application No.: US11773658Application Date: 2007-07-05
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Publication No.: US07948459B2Publication Date: 2011-05-24
- Inventor: Tetsuya Ohtomo
- Applicant: Tetsuya Ohtomo
- Applicant Address: JP Tokyo
- Assignee: Toshiba Matsushita Displays Technology Co., Ltd.
- Current Assignee: Toshiba Matsushita Displays Technology Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-188464 20060707
- Main IPC: G09G3/36
- IPC: G09G3/36

Abstract:
A display device includes scanning lines disposed along rows of display pixels, signal lines disposed along columns of the display pixels, pixel switches disposed near intersections between the scanning lines and the signal lines, pixel electrodes connected to the pixel switches, a counter-electrode disposed to be opposed to the pixel electrodes, storage capacitance lines disposed substantially parallel to the scanning lines, first inspection switches connected to the scanning lines in a peripheral section, second inspection switches connected to the signal lines in the peripheral section, a first wiring line which supplies a signal for turning on/off the first inspection switches, a second wiring line which supplies a signal for turning on/off the second inspection switches, and a third wiring line which applies a signal to the counter-electrode and the storage capacitance lines.
Public/Granted literature
- US20080123012A1 DISPLAY DEVICE AND INSPECTION METHOD FOR DISPLAY DEVICE Public/Granted day:2008-05-29
Information query
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