Invention Grant
- Patent Title: Position accuracy evaluation method and position accuracy evaluation apparatus
- Patent Title (中): 位置精度评估方法和位置精度评估装置
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Application No.: US11375812Application Date: 2006-03-15
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Publication No.: US07948516B2Publication Date: 2011-05-24
- Inventor: Yutaka Unno , Taiji Kiku
- Applicant: Yutaka Unno , Taiji Kiku
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2005-077929 20050317
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H05B3/68

Abstract:
According to a related art for evaluating the position accuracy of heaters with respect to the plate, it is necessary to attach an energizing electrode to the heaters, and energize the heaters for a predetermined period to heat the entire plate, before measuring the temperature distribution map. Therefore, there is a problem in that several tens of minutes are required until the temperature distribution map can be measured. As the plate becomes larger, the time required for energizing the heaters to heat the entire plate becomes longer. A technique for evaluating the position accuracy of heaters with respect to the plate, without executing a process for energizing the heaters to heat the plate is disclosed.
Public/Granted literature
- US20060207987A1 Position accuracy evaluation method and position accuracy evaluation apparatus Public/Granted day:2006-09-21
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