Invention Grant
- Patent Title: Semiconductor sensor device having a correction circuit
- Patent Title (中): 具有校正电路的半导体传感器装置
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Application No.: US09796249Application Date: 2001-02-28
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Publication No.: US07948530B2Publication Date: 2011-05-24
- Inventor: Kuniyuki Okuyama
- Applicant: Kuniyuki Okuyama
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: JP2000-055205 20000301
- Main IPC: H01L29/04
- IPC: H01L29/04

Abstract:
An imaging device includes a read circuit having a bias circuit for biasing the signal currents output from a sensor array to correct variations of the sensor array. The bias current is determined so that the number of pixel data output from the read circuit which are below or above the threshold is equal to a specified number setting for the number of pixel data. A fixed pattern noise (FPN) correction circuit determines the full scale of the FPN correction current based on the bias current.
Public/Granted literature
- US20010050366A1 Semiconductor sensor device having a correction circuit Public/Granted day:2001-12-13
Information query
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