Invention Grant
US07948530B2 Semiconductor sensor device having a correction circuit 失效
具有校正电路的半导体传感器装置

Semiconductor sensor device having a correction circuit
Abstract:
An imaging device includes a read circuit having a bias circuit for biasing the signal currents output from a sensor array to correct variations of the sensor array. The bias current is determined so that the number of pixel data output from the read circuit which are below or above the threshold is equal to a specified number setting for the number of pixel data. A fixed pattern noise (FPN) correction circuit determines the full scale of the FPN correction current based on the bias current.
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