Invention Grant
- Patent Title: Measurement system
- Patent Title (中): 测量系统
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Application No.: US12207105Application Date: 2008-09-09
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Publication No.: US07948612B2Publication Date: 2011-05-24
- Inventor: Masakatsu Kaneko , Sze Yun Set , Chee Seong Goh , Morisato Namikawa , Yuichi Nagashima , Tomoharu Kotake , Hiroshi Yaguchi
- Applicant: Masakatsu Kaneko , Sze Yun Set , Chee Seong Goh , Morisato Namikawa , Yuichi Nagashima , Tomoharu Kotake , Hiroshi Yaguchi
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Honda Motor Co., Ltd.,Alnair Laboratories Corporation
- Current Assignee: Honda Motor Co., Ltd.,Alnair Laboratories Corporation
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2007-234454 20070910
- Main IPC: G01C3/08
- IPC: G01C3/08
Abstract:
A measurement system 1 for measuring a distance to an object to be measured, includes: a half mirror 10; a measurement light emitting unit 11; a projection unit 12; a light-receiving unit 13; a distance calculation unit 14; and a diffusion lens 16.
Public/Granted literature
- US20090066930A1 MEASUREMENT SYSTEM Public/Granted day:2009-03-12
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