Invention Grant
- Patent Title: Phase-shifting interferometry in the presence of vibration
- Patent Title (中): 在存在振动的情况下进行相移干涉测量
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Application No.: US12849978Application Date: 2010-08-04
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Publication No.: US07948639B2Publication Date: 2011-05-24
- Inventor: Leslie L. Deck
- Applicant: Leslie L. Deck
- Applicant Address: US CT Middlefield
- Assignee: Zygo Corporation
- Current Assignee: Zygo Corporation
- Current Assignee Address: US CT Middlefield
- Agency: Fish & Richardson, P.C.
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
A phase-shifting interferometry (PSI) method and corresponding system including: (i) recording an interferogram for each phase in a sequence of phases between test light reflected from a test surface and reference light reflected from a reference surface, the test and reference light being derived from a common source, each interferogram corresponding to an intensity pattern produced by interfering the reflected test light with the reflected reference light, the interferograms defining an interferometry signal for each of different transverse locations of a cavity defined by the test and reference surfaces, each interferometry signal including a series of intensity values corresponding to the sequence of phases, with the difference between each pair of phases in the sequence defining a corresponding phase shift increment; (ii) calculating an initial phase map for the cavity based on at least some of the recorded interferograms; (iii) calculating an estimate for each of at least some of the phase shift increments based on the initial phase map and at least some of the recorded interferograms; and (iv) calculating an improved phase map based on the calculated estimates for the phase shift increments and at least some of the recorded interferograms.
Public/Granted literature
- US20110026036A1 PHASE-SHIFTING INTERFEROMETRY IN THE PRESENCE OF VIBRATION Public/Granted day:2011-02-03
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