Invention Grant
- Patent Title: Semiconductor device and method for inspecting the same
- Patent Title (中): 半导体装置及其检查方法
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Application No.: US12054968Application Date: 2008-03-25
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Publication No.: US07948728B2Publication Date: 2011-05-24
- Inventor: Shinichiro Kataoka , Takehiro Yano
- Applicant: Shinichiro Kataoka , Takehiro Yano
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: JP2007-089349 20070329
- Main IPC: H02H3/24
- IPC: H02H3/24 ; H02H9/00 ; H02H3/00

Abstract:
A semiconductor device of the present invention includes: a power input terminal; an internal power supply circuit that converts a voltage supplied from the outside to the power input terminal into a predetermined voltage; an analog circuit connected to an output side of the internal power supply circuit; an internal power output terminal connected to the output side of the internal power supply circuit; a logic circuit power input terminal; a logic circuit connected to the logic circuit power input terminal; and interterminal wiring connecting the internal power output terminal to the logic circuit power input terminal. The internal power supply circuit has a configuration of supplying power to the analog circuit and the logic circuit, and in a package assembly (finished product), a resting current in the logic circuit can be inspected without being influence by a consumption current in the analog circuit.
Public/Granted literature
- US20080239605A1 SEMICONDUCTOR DEVICE AND METHOD FOR INSPECTING THE SAME Public/Granted day:2008-10-02
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