Invention Grant
US07948728B2 Semiconductor device and method for inspecting the same 有权
半导体装置及其检查方法

Semiconductor device and method for inspecting the same
Abstract:
A semiconductor device of the present invention includes: a power input terminal; an internal power supply circuit that converts a voltage supplied from the outside to the power input terminal into a predetermined voltage; an analog circuit connected to an output side of the internal power supply circuit; an internal power output terminal connected to the output side of the internal power supply circuit; a logic circuit power input terminal; a logic circuit connected to the logic circuit power input terminal; and interterminal wiring connecting the internal power output terminal to the logic circuit power input terminal. The internal power supply circuit has a configuration of supplying power to the analog circuit and the logic circuit, and in a package assembly (finished product), a resting current in the logic circuit can be inspected without being influence by a consumption current in the analog circuit.
Public/Granted literature
Information query
Patent Agency Ranking
0/0