Invention Grant
- Patent Title: Multiple focal spot X-ray tube with multiple electron beam manipulating units
- Patent Title (中): 多焦点X射线管与多个电子束操纵单元
-
Application No.: US12513861Application Date: 2007-10-30
-
Publication No.: US07949102B2Publication Date: 2011-05-24
- Inventor: Rolf Karl Otto Behling
- Applicant: Rolf Karl Otto Behling
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP06123817 20061110
- International Application: PCT/IB2007/054397 WO 20071030
- International Announcement: WO2008/056299 WO 20080515
- Main IPC: H01J35/08
- IPC: H01J35/08

Abstract:
A multiple focal spot X-ray tube (100) comprising an electron source (105), which is adapted to generate an electron beam (106), an anode (110), which is arranged within the electron beam (106) and which comprises a first focal spot portion (120) and a second focal spot portion (130), whereby the second focal spot portion (130) is spatially separated from the first focal spot portion (120). The X-ray tube (100) further comprises a first electron beam manipulation unit (125), which is adapted to interact with the electron beam (106), when the electron beam (106) impinges onto the first focal spot portion (120), and a second electron beam manipulation unit (135), which is adapted to interact with the electron beam (106), when the electron beam (106) impinges onto the second focal spot portion (130). By assigning one electron beam manipulation unit (125, 135) to each of the focal spot portions (120, 130), a precise focusing of the X-ray beam can be realized individually for each focal spot of the X-ray tube (100). Preferably, the first and the second focal spot portions have a distance along the axis of a rotating anode.
Public/Granted literature
- US20100046712A1 MULTIPLE FOCAL SPOT X-RAY TUBE WITH MULTIPLE ELECTRON BEAM MANIPULATING UNITS Public/Granted day:2010-02-25
Information query