Invention Grant
- Patent Title: Program and apparatus for generating system test specifications
- Patent Title (中): 用于生成系统测试规范的程序和设备
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Application No.: US12068353Application Date: 2008-02-05
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Publication No.: US07949901B2Publication Date: 2011-05-24
- Inventor: Keisuke Yano , Tsuyoshi Kanai
- Applicant: Keisuke Yano , Tsuyoshi Kanai
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2007-078077 20070326
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
A computer program automatically producing a system test specification adapted for real-life use of a computer system, such that the system's most important processing functions can be tested. An update record storage unit stores update records each including: a process identifier of a data updating process, the name of a dataset updated by that process, and an update timestamp. A function test data storage unit stores data of function tests for checking whether each module realizing operation steps of an operation flow satisfies specified requirements. An operation flow extractor creates a flow descriptor enumerating the names of datasets updated by a data updating process in chronological order. From the stored function test data, a system test generator compiles a system test description for each operation flow, which specifies a series of function tests in the same order as the operation steps constituting each operation flow.
Public/Granted literature
- US20080244317A1 Program and apparatus for generating system test specifications Public/Granted day:2008-10-02
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