Invention Grant
- Patent Title: Method and device for estimating simultaneous switching noise in semiconductor device, and storage medium
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Application No.: US11882293Application Date: 2007-07-31
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Publication No.: US07949977B2Publication Date: 2011-05-24
- Inventor: Yasuo Kouzaki , Shinichiro Uekusa
- Applicant: Yasuo Kouzaki , Shinichiro Uekusa
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Kratz, Quintos & Hanson, LLP
- Priority: JP2006-209098 20060731; JP2007-120060 20070427
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
The method comprises a number of simultaneously switching signals calculation step in which the number of simultaneously switching signals is calculated for each set of user setting information for the input and output signal on the basis of pin arrangement information and the user setting information of the pins in a neighboring area of a pin to be executed in the estimation process; and a simultaneous switching noise calculation step in which a difference is calculated between noise corresponding to an initial point and that to a terminal point in a range of the number of simultaneously switching signals calculated for each set of user setting information on the basis of a relationship between the number of simultaneously switching signals and the noise caused by the number of simultaneously switching signals for each set of user setting information.
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