Invention Grant
US07952379B2 Substrate testing device and method thereof 有权
基板测试装置及其方法

Substrate testing device and method thereof
Abstract:
Exemplary embodiments relate to a substrate testing device having a comparator adapted to compare a power supply voltage supplied by a power supply voltage line with a dropped power supply voltage detected by a power supply voltage detection line and to output a voltage difference, and a level shifter circuit adapted to compensate a data voltage with a voltage up to an amount equal to the voltage difference output from the comparator and to supply the data voltage to a display panel.
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