Invention Grant
- Patent Title: Substrate testing device and method thereof
- Patent Title (中): 基板测试装置及其方法
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Application No.: US11905908Application Date: 2007-10-05
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Publication No.: US07952379B2Publication Date: 2011-05-31
- Inventor: Wonkyu Kwak
- Applicant: Wonkyu Kwak
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Mobile Display Co., Ltd.
- Current Assignee: Samsung Mobile Display Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2007-0004432 20070115
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
Exemplary embodiments relate to a substrate testing device having a comparator adapted to compare a power supply voltage supplied by a power supply voltage line with a dropped power supply voltage detected by a power supply voltage detection line and to output a voltage difference, and a level shifter circuit adapted to compensate a data voltage with a voltage up to an amount equal to the voltage difference output from the comparator and to supply the data voltage to a display panel.
Public/Granted literature
- US20080169822A1 Substrate testing device and method thereof Public/Granted day:2008-07-17
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