Invention Grant
US07954009B2 Test executive system with memory leak detection for user code modules
有权
测试执行系统与用户代码模块的内存泄漏检测
- Patent Title: Test executive system with memory leak detection for user code modules
- Patent Title (中): 测试执行系统与用户代码模块的内存泄漏检测
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Application No.: US12399250Application Date: 2009-03-06
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Publication No.: US07954009B2Publication Date: 2011-05-31
- Inventor: James A. Grey
- Applicant: James A. Grey
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Jason L. Burgess
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A system and method for automatically detecting heap corruption errors and memory leak errors caused by user-supplied code modules that are called by steps of a test executive sequence. The test executive sequence may first be created by including a plurality of test executive steps in the test executive sequence and configuring at least a subset of the steps to call user-supplied code modules. The test executive sequence may then be executed on a host computer under control of a test executive engine. For each step that calls a user-supplied code module, the test executive engine may perform certain actions to automatically detect whether the user-supplied code module causes a heap corruption error and/or automatically detect whether the user-supplied code module causes a memory leak error.
Public/Granted literature
- US20090172476A1 Test Executive System with Memory Leak Detection for User Code Modules Public/Granted day:2009-07-02
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