Invention Grant
- Patent Title: Fault detection
- Patent Title (中): 故障检测
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Application No.: US11648853Application Date: 2006-12-29
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Publication No.: US07954038B2Publication Date: 2011-05-31
- Inventor: Paul Racunas , Srilatha Manne , Kypros Constantinides , Shubhendu S. Mukherjee
- Applicant: Paul Racunas , Srilatha Manne , Kypros Constantinides , Shubhendu S. Mukherjee
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Caven & Aghevli LLC
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Methods and apparatus to efficiently detect faults are described. In an embodiment, an encoded value may be generated based on a portion of an instruction address and a portion of a corresponding result value. The encoded value may be used to determine whether an entry corresponding to the encoded value is absent from a screening storage unit. Other embodiments are also described.
Public/Granted literature
- US20080163010A1 Fault detection Public/Granted day:2008-07-03
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