Invention Grant
- Patent Title: Microscopic-measurement apparatus
- Patent Title (中): 显微镜测量装置
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Application No.: US12117252Application Date: 2008-05-08
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Publication No.: US07954069B2Publication Date: 2011-05-31
- Inventor: Masaaki Yumoto , Kenichi Akao , Yoshiko Akao , Jun Koshoubu
- Applicant: Masaaki Yumoto , Kenichi Akao , Yoshiko Akao , Jun Koshoubu
- Applicant Address: JP Hachioji-shi, Tokyo
- Assignee: JASCO Corporation
- Current Assignee: JASCO Corporation
- Current Assignee Address: JP Hachioji-shi, Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2007-125849 20070510
- Main IPC: G06F15/00
- IPC: G06F15/00 ; G06F13/00

Abstract:
A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.
Public/Granted literature
- US20080282197A1 Microscopic-Measurement Apparatus Public/Granted day:2008-11-13
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