Invention Grant
US07954945B2 Reflectometry/interferometry system and method for corneal plane positioning 有权
角膜平面定位的反射/干涉测量系统和方法

  • Patent Title: Reflectometry/interferometry system and method for corneal plane positioning
  • Patent Title (中): 角膜平面定位的反射/干涉测量系统和方法
  • Application No.: US12612924
    Application Date: 2009-11-05
  • Publication No.: US07954945B2
    Publication Date: 2011-06-07
  • Inventor: Mark D. Hopler
  • Applicant: Mark D. Hopler
  • Applicant Address: US TX Fort Worth
  • Assignee: Alcon Refractivehorizons, Inc.
  • Current Assignee: Alcon Refractivehorizons, Inc.
  • Current Assignee Address: US TX Fort Worth
  • Agent Armando Pastrana, Jr.
  • Main IPC: A61B3/10
  • IPC: A61B3/10
Reflectometry/interferometry system and method for corneal plane positioning
Abstract:
A system for positioning an eye of a patient, for example, for laser ophthalmic surgery includes a reflectometer adapted to receive as input a reflected beam from an anterior surface of a cornea of an eye of a patient. The interferometer is calibratable to a desired position of the corneal anterior surface. A comparator is in signal communication with the interferometer and is adapted to calculate from the input a difference between an actual position and the desired position of the corneal anterior surface. A device is in signal communication with the comparator for moving the patient a distance in a direction for matching the actual position to the desired position of the corneal anterior surface.
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