Invention Grant
US07954945B2 Reflectometry/interferometry system and method for corneal plane positioning
有权
角膜平面定位的反射/干涉测量系统和方法
- Patent Title: Reflectometry/interferometry system and method for corneal plane positioning
- Patent Title (中): 角膜平面定位的反射/干涉测量系统和方法
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Application No.: US12612924Application Date: 2009-11-05
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Publication No.: US07954945B2Publication Date: 2011-06-07
- Inventor: Mark D. Hopler
- Applicant: Mark D. Hopler
- Applicant Address: US TX Fort Worth
- Assignee: Alcon Refractivehorizons, Inc.
- Current Assignee: Alcon Refractivehorizons, Inc.
- Current Assignee Address: US TX Fort Worth
- Agent Armando Pastrana, Jr.
- Main IPC: A61B3/10
- IPC: A61B3/10

Abstract:
A system for positioning an eye of a patient, for example, for laser ophthalmic surgery includes a reflectometer adapted to receive as input a reflected beam from an anterior surface of a cornea of an eye of a patient. The interferometer is calibratable to a desired position of the corneal anterior surface. A comparator is in signal communication with the interferometer and is adapted to calculate from the input a difference between an actual position and the desired position of the corneal anterior surface. A device is in signal communication with the comparator for moving the patient a distance in a direction for matching the actual position to the desired position of the corneal anterior surface.
Public/Granted literature
- US20100277689A1 Reflectometry/Interferometry system and method for corneal plane positioning Public/Granted day:2010-11-04
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