Invention Grant
- Patent Title: Scanned beam overlay projection
- Patent Title (中): 扫描光束叠加投影
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Application No.: US12182264Application Date: 2008-07-30
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Publication No.: US07954953B2Publication Date: 2011-06-07
- Inventor: Randall B. Sprague
- Applicant: Randall B. Sprague
- Applicant Address: US WA Redmond
- Assignee: Microvision, Inc.
- Current Assignee: Microvision, Inc.
- Current Assignee Address: US WA Redmond
- Agent Kevin D. Wills
- Main IPC: G03B21/26
- IPC: G03B21/26 ; G02B21/06 ; G01N21/86
Abstract:
A scanning beam overlay projection system displays an image on a projection surface by scanning a light beam in a raster pattern. Reflective spots on the projection surface reflect light back to the projection system when illuminated by the light beam. A photodetector in the projection system detects the reflected light, and timing circuits determine where in the raster pattern the reflective spots are located. The image can be scaled and warped to correlate tagged points within the image with the locations of the reflective spots on the projection surface.
Public/Granted literature
- US20100026960A1 Scanned Beam Overlay Projection Public/Granted day:2010-02-04
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