Invention Grant
US07955263B2 Non-invasive positioning system for locating the focus of high-intensity focused ultrasound
有权
非侵入性定位系统,用于定位高强度聚焦超声的焦点
- Patent Title: Non-invasive positioning system for locating the focus of high-intensity focused ultrasound
- Patent Title (中): 非侵入性定位系统,用于定位高强度聚焦超声的焦点
-
Application No.: US11707109Application Date: 2007-02-16
-
Publication No.: US07955263B2Publication Date: 2011-06-07
- Inventor: Chiung-Nien Chen , Po-Huang Lee , Wen-Shiang Chen , Ming-Chih Ho , Chih-Ching Wu
- Applicant: Chiung-Nien Chen , Po-Huang Lee , Wen-Shiang Chen , Ming-Chih Ho , Chih-Ching Wu
- Applicant Address: TW Taipei
- Assignee: National Taiwan University
- Current Assignee: National Taiwan University
- Current Assignee Address: TW Taipei
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW95105619A 20060220
- Main IPC: A61B8/00
- IPC: A61B8/00

Abstract:
A non-invasive positioning system for determining the focus location of a HIFU device comprises a diagnostic ultrasound and the HIFU for ablating and removing tumor tissue. The imaging plane of the diagnostic ultrasound probe and the geometrical axis of a probe of the HIFU define an inclining angle during operation. When the imaging plane of the diagnostic ultrasound intersected to the focus of the HIFU transducer, a maximal convergent interference signals was obtained, so as to position the HIFU focus within tumors for precise ablation.
Public/Granted literature
- US20070232912A1 Non-invasive positioning system for locating the focus of high-intensity focused ultrasound Public/Granted day:2007-10-04
Information query