Invention Grant
- Patent Title: Method and apparatus for measuring anatomic structures
- Patent Title (中): 用于测量解剖结构的方法和装置
-
Application No.: US11203904Application Date: 2005-08-15
-
Publication No.: US07955265B2Publication Date: 2011-06-07
- Inventor: Elina Burla , Doron Hess , Alexander Sokulin
- Applicant: Elina Burla , Doron Hess , Alexander Sokulin
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: The Small Patent Law Group
- Agent Dean Small
- Main IPC: A61B8/14
- IPC: A61B8/14

Abstract:
Methods, apparatus and systems for measuring a thickness of a portion of a multi-layer vessel based on at least one medical diagnostic image frame using an integrated ultrasound device is provided. The method includes for each x-coordinate determining a y-coordinate along an interface between each layer of the vessel including determining a Y coordinate of a center of an intima-media center (IMC) determining the adventitia-media interface Y coordinate, determining the intima-lumen interface Y coordinate, determining for each X coordinate the lumen-intima interface Y coordinate, determining media-adventitia interface Y coordinate, determining a thickness of at least one vessel layer using X and Y coordinates of respective layer interfaces, and outputting the thickness to a display.
Public/Granted literature
- US20070038084A1 Method and apparatus for measuring anatomic structures Public/Granted day:2007-02-15
Information query