Invention Grant
- Patent Title: Sputtering apparatus and film deposition method
- Patent Title (中): 溅射装置和成膜方法
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Application No.: US12683921Application Date: 2010-01-07
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Publication No.: US07955480B2Publication Date: 2011-06-07
- Inventor: Tetsuya Endo , Einstein Noel Abarra
- Applicant: Tetsuya Endo , Einstein Noel Abarra
- Applicant Address: JP Kawasaki-shi
- Assignee: Canon Anelva Corporation
- Current Assignee: Canon Anelva Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Main IPC: C23C14/35
- IPC: C23C14/35

Abstract:
The present invention provides a sputtering apparatus and a film deposition method capable of forming a magnetic film with reduced variations in the direction of magnetic anisotropy. The sputtering apparatus of the present invention is provided with a rotatable cathode (802), a rotatable stage (801) and a rotatable shielding plate (805). The sputtering apparatus controls the rotation of at least one of the cathode (802), stage (801) and shielding plate (805) so that sputtered particles impinging at an angle formed with respect to a normal line of the substrate (804) of 0° or more and 50° or less out of sputtered particles generated from the target (803a) during sputtering are made to impinge on the substrate (804).
Public/Granted literature
- US20100155229A1 SPUTTERING APPARATUS AND FILM DEPOSITION METHOD Public/Granted day:2010-06-24
Information query
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