Invention Grant
US07955750B2 Controlled electrode overlap architecture for improved MEA durability
有权
控制电极重叠结构,提高MEA耐久性
- Patent Title: Controlled electrode overlap architecture for improved MEA durability
- Patent Title (中): 控制电极重叠结构,提高MEA耐久性
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Application No.: US11358670Application Date: 2006-02-21
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Publication No.: US07955750B2Publication Date: 2011-06-07
- Inventor: James Leistra , Ronald L. James , David Dobulis
- Applicant: James Leistra , Ronald L. James , David Dobulis
- Applicant Address: US MI Detroit
- Assignee: GM Global Technology Operations LLC
- Current Assignee: GM Global Technology Operations LLC
- Current Assignee Address: US MI Detroit
- Agency: Miller IP Group, PLC
- Agent John A. Miller
- Main IPC: H01M2/08
- IPC: H01M2/08 ; H01M2/14 ; H01M2/20 ; H01M8/10 ; H01M8/24

Abstract:
A membrane electrode assembly includes a membrane layer, a cathode or anode catalyst layer adjacent to a surface of the membrane layer, an anode or cathode catalyst layer adjacent to an other surface of the membrane layer, an adhesive layer adjacent to the other surface of the membrane layer, wherein the adhesive layer abuts a surface of the anode or cathode catalyst layer, and a subgasket layer having an edge portion, wherein the subgasket layer is adjacent to a surface of the adhesive layer, wherein the cathode catalyst layer and anode catalyst layer extend along a length of the membrane layer relative to the edge portion of the subgasket layer, wherein the cathode or anode catalyst layer extends a greater length along the length of the membrane layer than the anode or cathode catalyst layer relative to the edge portion of the subgasket layer.
Public/Granted literature
- US20070196718A1 Controlled electrode overlap architecture for improved MEA durability Public/Granted day:2007-08-23
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