Invention Grant
US07956430B2 Semiconductor device including groove width variation portion for inspection
失效
半导体装置,包括用于检查的槽宽度变化部
- Patent Title: Semiconductor device including groove width variation portion for inspection
- Patent Title (中): 半导体装置,包括用于检查的槽宽度变化部
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Application No.: US12556856Application Date: 2009-09-10
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Publication No.: US07956430B2Publication Date: 2011-06-07
- Inventor: Yoshihide Tasaki
- Applicant: Yoshihide Tasaki
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, P.L.L.C.
- Priority: JP2005-250569 20050831
- Main IPC: H01L29/84
- IPC: H01L29/84

Abstract:
An accelerator sensor includes a semiconductor substrate having a main front surface and a main rear surface, a first groove portion being formed along a front surface pattern, in the main front surface, a second groove portion being formed along a rear surface pattern, in the main rear surface, a through-hole being formed because of connection between at least parts of the first groove portion and the second groove portion and at least one groove width variation portion being formed in at least one of inner walls of the first groove portion. An offset of the rear surface pattern to the front surface pattern can be inspected easily by existence of the groove width variation portion.
Public/Granted literature
- US20090321858A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING AND INSPECTION THEREOF Public/Granted day:2009-12-31
Information query
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