Invention Grant
- Patent Title: Nitrogen analyzing apparatus
- Patent Title (中): 氮分析仪
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Application No.: US12279630Application Date: 2007-02-09
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Publication No.: US07957003B2Publication Date: 2011-06-07
- Inventor: Naoho Baba
- Applicant: Naoho Baba
- Applicant Address: JP Tokyo
- Assignee: Taiyo Nippon Sanso Corporation
- Current Assignee: Taiyo Nippon Sanso Corporation
- Current Assignee Address: JP Tokyo
- Agency: Nixon & Vanderhye P.C.
- Priority: JP2006-041872 20060220
- International Application: PCT/JP2007/052343 WO 20070209
- International Announcement: WO2007/097211 WO 20070830
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
The present invention provides a nitrogen analyzing apparatus comprising: a nitrogen concentration measuring device configured to measure the concentration of an nitrogen impurities in a mixed gas including argon and oxygen as main components on the basis of emission intensity of a light emitted from the nitrogen impurities by an electric discharge in a discharge tube and an oxygen concentration of a sample gas introduced into the discharge tube, and a diluting oxygen-introducing device configured to add a diluting oxygen in the sample gas sampled from the mixed gas according to the oxygen concentration of the mixed gas.
Public/Granted literature
- US20100220320A1 NITROGEN ANALYZING APPARATUS Public/Granted day:2010-09-02
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